High resolution energy loss research: Si compounds and ceramics

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Our current investigation of the structure and chemistry of whisker/matrix interfaces and matrix grain boundaries in SiC whisker reinforced Si{sub 3}N{sub 4} composites has been completed. We examined these interfaces and boundaries in four composites whose starting materials and processing were identical except for the SiC whiskers themselves, which were from four different sources: American matrix, Nikkei, Huber and Tokai. Thus, differences in interfaces among the composites are attributable to differences in the whiskers. The results showed that oxygen-rich amorphous interfacial layers were discontinuous in all whisker/matrix interfaces and continuous in all matrix grain boundaries. Further, we used position-resolved high … continued below

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4 pages

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Carpenter, R. W. & Lin, S. H. January 1, 1992.

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  • Arizona State University
    Publisher Info: Arizona State Univ., Tempe, AZ (United States)
    Place of Publication: Tempe, Arizona

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Our current investigation of the structure and chemistry of whisker/matrix interfaces and matrix grain boundaries in SiC whisker reinforced Si{sub 3}N{sub 4} composites has been completed. We examined these interfaces and boundaries in four composites whose starting materials and processing were identical except for the SiC whiskers themselves, which were from four different sources: American matrix, Nikkei, Huber and Tokai. Thus, differences in interfaces among the composites are attributable to differences in the whiskers. The results showed that oxygen-rich amorphous interfacial layers were discontinuous in all whisker/matrix interfaces and continuous in all matrix grain boundaries. Further, we used position-resolved high spatial resolution electron energy loss spectroscopy to show that the chemical interface width'' is much wider than the geometric or structural interface width'' at both types of interfaces in all four composites. The geometric interface widths were determined from high resolution transmission electron microscope images of edge-on interfaces.

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4 pages

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OSTI; NTIS; GPO Dep.

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  • January 1, 1992

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  • Feb. 18, 2018, 3:59 p.m.

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  • March 8, 2022, 10:55 a.m.

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Carpenter, R. W. & Lin, S. H. High resolution energy loss research: Si compounds and ceramics, report, January 1, 1992; Tempe, Arizona. (https://digital.library.unt.edu/ark:/67531/metadc1099424/: accessed June 10, 2024), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.

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