Our current investigation of the structure and chemistry of whisker/matrix interfaces and matrix grain boundaries in SiC whisker reinforced Si{sub 3}N{sub 4} composites has been completed. We examined these interfaces and boundaries in four composites whose starting materials and processing were identical except for the SiC whiskers themselves, which were from four different sources: American matrix, Nikkei, Huber and Tokai. Thus, differences in interfaces among the composites are attributable to differences in the whiskers. The results showed that oxygen-rich amorphous interfacial layers were discontinuous in all whisker/matrix interfaces and continuous in all matrix grain boundaries. Further, we used position-resolved high …
continued below
Publisher Info:
Arizona State Univ., Tempe, AZ (United States)
Place of Publication:
Tempe, Arizona
Provided By
UNT Libraries Government Documents Department
Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.
Descriptive information to help identify this report.
Follow the links below to find similar items on the Digital Library.
Description
Our current investigation of the structure and chemistry of whisker/matrix interfaces and matrix grain boundaries in SiC whisker reinforced Si{sub 3}N{sub 4} composites has been completed. We examined these interfaces and boundaries in four composites whose starting materials and processing were identical except for the SiC whiskers themselves, which were from four different sources: American matrix, Nikkei, Huber and Tokai. Thus, differences in interfaces among the composites are attributable to differences in the whiskers. The results showed that oxygen-rich amorphous interfacial layers were discontinuous in all whisker/matrix interfaces and continuous in all matrix grain boundaries. Further, we used position-resolved high spatial resolution electron energy loss spectroscopy to show that the chemical interface width'' is much wider than the geometric or structural interface width'' at both types of interfaces in all four composites. The geometric interface widths were determined from high resolution transmission electron microscope images of edge-on interfaces.
This report is part of the following collection of related materials.
Office of Scientific & Technical Information Technical Reports
Reports, articles and other documents harvested from the Office of Scientific and Technical Information.
Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.
Carpenter, R. W. & Lin, S. H.High resolution energy loss research: Si compounds and ceramics,
report,
January 1, 1992;
Tempe, Arizona.
(https://digital.library.unt.edu/ark:/67531/metadc1099424/:
accessed June 10, 2024),
University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu;
crediting UNT Libraries Government Documents Department.