Low Energy X-Ray Spectra Measured With a Mercuric Iodide Energy Dispersive Spectrometer in a Scanning Electron Microscope

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A mercuric iodide energy dispersive x-ray spectrometer, with Peltier cooling provided for the detector and input field effect transistor, has been developed and tested in a scanning electron microscope. X-ray spectra were obtained with the 15 keV electron beam. An energy resolution of 225 eV (FWHM) for Mn-K/sub ..cap alpha../ at 5.9 keV and 195 eV (FWHM) for Mg-K line at 1.25 keV has been measured. Overall system noise level was 175 eV (FWHM). The detector system characterization with a carbon target demonstrated good energy sensitivity at low energies and lack of significant spectral artifacts at higher energies. 16 refs., … continued below

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5 pages

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Iwanczyk, J. S.; Dabrowski, A. J.; Huth, G. C.; Bradley, J. G.; Conley, J. M. & Albee, A. L. January 1, 1985.

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A mercuric iodide energy dispersive x-ray spectrometer, with Peltier cooling provided for the detector and input field effect transistor, has been developed and tested in a scanning electron microscope. X-ray spectra were obtained with the 15 keV electron beam. An energy resolution of 225 eV (FWHM) for Mn-K/sub ..cap alpha../ at 5.9 keV and 195 eV (FWHM) for Mg-K line at 1.25 keV has been measured. Overall system noise level was 175 eV (FWHM). The detector system characterization with a carbon target demonstrated good energy sensitivity at low energies and lack of significant spectral artifacts at higher energies. 16 refs., 5 figs.

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NTIS, PC A02/MF A01; 1.

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  • IEEE nuclear science symposium, San Francisco, CA, USA, 23 Oct 1985

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  • Other: DE86011963
  • Report No.: CONF-851009-72
  • Grant Number: AT03-77EV72031
  • Office of Scientific & Technical Information Report Number: 5624810
  • Archival Resource Key: ark:/67531/metadc1089087

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  • January 1, 1985

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Iwanczyk, J. S.; Dabrowski, A. J.; Huth, G. C.; Bradley, J. G.; Conley, J. M. & Albee, A. L. Low Energy X-Ray Spectra Measured With a Mercuric Iodide Energy Dispersive Spectrometer in a Scanning Electron Microscope, article, January 1, 1985; United States. (https://digital.library.unt.edu/ark:/67531/metadc1089087/: accessed June 8, 2024), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.

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