Pinhole-assisted point-projection backlighting with 10{micro}m and 5 {micro}m pinholes placed a small distance of order 1 mm away from the backlighter produces images with large field of view and high resolution. Pinholes placed closely to high-power backlighter sources can vaporize and close due to x-ray driven ablation, thereby limiting the usefulness of this method. A study of streaked 1-D backlit imaging of 25 {micro}m W wires using the OMEGA laser is presented. The pinhole closure timescale for 10 {micro}m pinholes placed 0.45 mm and 1 mm distant from the backlighter is 1.3 ns and 2.2 ns, respectively. Similar timescales for …
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Lawrence Livermore National Lab., Livermore, CA (United States)
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Pinhole-assisted point-projection backlighting with 10{micro}m and 5 {micro}m pinholes placed a small distance of order 1 mm away from the backlighter produces images with large field of view and high resolution. Pinholes placed closely to high-power backlighter sources can vaporize and close due to x-ray driven ablation, thereby limiting the usefulness of this method. A study of streaked 1-D backlit imaging of 25 {micro}m W wires using the OMEGA laser is presented. The pinhole closure timescale for 10 {micro}m pinholes placed 0.45 mm and 1 mm distant from the backlighter is 1.3 ns and 2.2 ns, respectively. Similar timescales for 5 {micro}m pinholes is also presented. Successful wire imaging prior to pinhole closure is clearly demonstrated.
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Bullock, A. B.; Landen, O. L. & Bradley, D. K.10 (micro)m and 5 (micro)m Pinhole-Assisted Point-Projection Backlit Imaging for NIF,
article,
June 5, 2001;
Livermore, California.
(https://digital.library.unt.edu/ark:/67531/metadc742645/:
accessed May 28, 2024),
University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu;
crediting UNT Libraries Government Documents Department.