Thin film samples of a simple embedded nanocluster system consisting of solid Xe precipitates in Al have been subjected to 1 MeV electron irradiation in a high-voltage electron microscope. High-resolution images have been recorded on videotape in order to monitor the changes to the system resulting from the passage of electrons through the film. Inspection of the video recordings (in some cases frame-by-frame) reveals that complex, rapid processes occur under the electron beam. These include, movement of small clusters, coalescence of neighboring clusters, shape changes, the apparent melting and resolidification of the Xe, and the creation and annealing of extended …
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Argonne National Lab., IL (United States)
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Illinois
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Thin film samples of a simple embedded nanocluster system consisting of solid Xe precipitates in Al have been subjected to 1 MeV electron irradiation in a high-voltage electron microscope. High-resolution images have been recorded on videotape in order to monitor the changes to the system resulting from the passage of electrons through the film. Inspection of the video recordings (in some cases frame-by-frame) reveals that complex, rapid processes occur under the electron beam. These include, movement of small clusters, coalescence of neighboring clusters, shape changes, the apparent melting and resolidification of the Xe, and the creation and annealing of extended defects within the Xe lattice. A tentative interpretation of some of the observations is presented in terms of the electron-induced displacement processes at the surface of the clusters.
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Donnelly, S. E.; Furuya, K.; Song, M.; Birtcher, R. C. & Allen, C. W.1 MeV electron irradiation of solid Xe nanoclusters in Al : an in-situ HRTEM study.,
article,
December 5, 1997;
Illinois.
(https://digital.library.unt.edu/ark:/67531/metadc738815/:
accessed May 23, 2024),
University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu;
crediting UNT Libraries Government Documents Department.
