Silicon drift chamber studies for the RHIC STAR experiment
Description:
The two-hit resolution of a silicon drift chamber is measured using a pulsed Nd:Yag laser and a time digitizer readout. The data is analyzed by forming the covariance matrix in time samples, and transforming to a matrix in amplitude and time variation of each of the two hits. The resolution of the two-hit separation is found to be better than 25 microns with a drift field of 530 V/cm and a separation of more than 500 microns, with the resolution increasing to 50 microns as the separation nears …
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Date:
February 24, 1992
Creator:
Humanic, T.J.
Item Type:
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Partner:
UNT Libraries Government Documents Department