Investigation of photovoltaic mechanisms in polycrystalline thin-film solar cells. Interim technical report, November 1, 1980-July 31, 1981
Description:
Effort is reported on measurement technique development to assess the utility of Deep-Level Transient Spectroscopy (DLTS) methods in characterizing polycrystalline silicon that was deliberately doped with Ti during growth. Difficulties encountered with lateral DLTS measurements are discussed. In this approach, modulation of the grain boundary, double-depletion region produces the entire DLTS signal. Major effort has been applied in grain boundary characterization and control. The most significa…
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Date:
March 5, 1982
Creator:
Temofonte, T. A.; Szedon, J. R. & O'Keeffe, T. W.
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UNT Libraries Government Documents Department