Aberration correction for analytical in situ TEM - the NTEAM concept.
Description:
Future aberration corrected transmission electron microscopes (TEM) will have a strong impact in materials science, since such microscopes yield information on chemical bonding and structure of interfaces, grain boundaries and lattice defects at an atomic level. Beyond this aberration correction offers new possibilities for in situ experiments performed under controlled temperature, magnetic field, strain etc. at atomic resolution. Such investigations are necessary for solving problems arising …
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Date:
March 5, 2002
Creator:
Kabius, B.; Allen, C. W. & Miller, D. J.
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